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Vista Engineering Announces Addition toTesting Facility

Hitachi 2460

Scanning Electron Microscope

Features:                                     

X-Ray Chemical Analysis

Large Environmental Chamber

Minimal Sample Preparation

Maximum Sample Preservation

The Hitachi 2460 is a “no preparation,” “any sample” SEM. It is ideal for the analysis of wet, oily, dirty, non-conductive specimens with little to no sample preparation required. Metals. Plastics. Semiconductors. Textiles. Biological and Geological samples. Pharmaceuticals.

Courteous professional service from our highly qualified engineering staff will strive to provide results within 24 hours.      

SEM Specifications:

Sample size: 4.5 inches in diameter, 1.5 inches in height

Magnification: x20 ~ 200,000

Secondary and Backscatter electron detectors

EDX spectrometer

Quartz PCI digital image management

 

SEM cast al

SEM steel

SEM plastic


 

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